Post on 27-Jun-2020
ASTS 2013
Agilent Science & Technology Symposium
Stop Worrying About Interferences With
These ICP-OES Solutions
Steve Wall
Agilent Technologies
Page 1
Agilent ICP-OES The world's most productive high performance simultaneous ICP-OES
•Continuous wavelength coverage
provides extended dynamic range and
reduced interferences, giving you
maximum confidence in your results
•Robust plasma ensures reliable and
reproducible results—even with the most
complex matrices
•One view, one step measurement of
major, minor, and trace elements, plus the
fastest warm-up, increases throughput
and productivity
•Unique FBC (fitted background correction)
simplifies method development by
eliminating correction point selection
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Agilent ICP-OES - Computer-optimized echelle optical and detector design
Page 3
USP Webinar
Dec. 08, 2010
• Thermostatted to -35oC for low noise
• Adaptive Integration Technology (AIT)
• Provides true simultaneous measurement
• All wavelengths irrespective of signal intensity
• Background signal and internal standards
• Thermostatted to 35oC for stability and fast
start-up
• All wavelengths captured in one reading
• Fewer optical components
• High light throughput
• Excellent signal-to-noise
ICP-OES Long Term Stability Continuing Calibration Verification (CCV)
60
70
80
90
100
110
120
0 1 2 3 4 5 6 7 8 9
Time (Hours)
% R
eco
very
of
CC
V
Ag 328.068
Al 237.312
As 188.980
Ba 585.367
Be 313.042
Ca 315.887
Cd 214.439
Co 228.615
Cr 267.716
Cu 324.754
Fe 238.204
K 769.897
M g 285.213
M n 257.610
Na 568.821
Ni 231.604
Pb 220.353
Sb 217.582
Se 196.026
Tl 190.794
V 292.401
Zn 206.200
Lower limit
Upper limit
Long-term precision (RSD): 0.98% MAX
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USP Webinar
Dec. 08, 2010
700-ES Interference Avoidance and Removal Tools
– Wavelength Database
– Confirmation and Qualifier Wavelengths
– Hidden Wavelengths
– Semi Quant
– Echellogram (720 and 725-ES)
– Fitted Background Correction (FBC)
– FACT Spectral Deconvolution
– Optimization Strategy
Page 5
700-ES Interference Avoidance and Removal Tools
– Wavelength Database
– Confirmation and Qualifier Wavelengths
– Hidden Wavelengths
– Semi Quant
– Echellogram (720 and 725-ES)
– Fitted Background Correction (FBC)
– FACT Spectral Deconvolution
– Optimization Strategy
Page 6
Wavelength Database
Wavelength database:
- Access to all wavelengths. Potential interferences
have been identified and appear in this database.
- Choose wavelengths based on freedom from
interferences as well as required sensitivity.
- Helps to know what elements are present in your
sample, although this is often not the case!
- Wavelengths are ranked as “most commonly used”
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Wavelength Database
Page 8
700-ES Interference Avoidance and Removal Tools
– Wavelength Database
– Confirmation and Qualifier Wavelengths
– Hidden Wavelengths
– Semi Quant
– Echellogram (720 and 725-ES)
– Fitted Background Correction (FBC)
– FACT Spectral Deconvolution
– Optimization Strategy
Page 9
Confirmation and Qualifier Wavelengths
11
Confirmation and Qualifier Wavelengths
Element Result Element Result
Er 337.275
Er 349.910
0.15
0.16
P 177.434
P 213.618
0.24
0.22
Fe 238.204
Fe 259.940
440
480
Si 251.611
Si 252.851
46.5
46.4
Mn 257.610
Mn 259.372
11.2
12.3
Sn 189.927
Sn 235.485
0.01
388
Ni 216.555
Ni 231.604
1.06
0.97
Sr 407.771
Sr 421.552
1.24
1.35
12
Confirmation and Qualifier Wavelengths
• Table shows likely cause
is Fe overlap
• Make use of interference
free wavelength
• If no alternate line, use
FACT modeling
700-ES Interference Avoidance and Removal Tools
– Wavelength Database
– Confirmation and Qualifier Wavelengths
– Hidden Wavelengths
– Semi Quant
– Echellogram (720 and 725-ES)
– Fitted Background Correction (FBC)
– FACT Spectral Deconvolution
– Optimization Strategy
Page 13
Hidden Wavelengths
Hidden Wavelengths
Hidden Wavelengths
700-ES Interference Avoidance and Removal Tools
– Wavelength Database
– Confirmation and Qualifier Wavelengths
– Hidden Wavelengths
– Semi Quant
– Echellogram (720 and 725-ES)
– Fitted Background Correction (FBC)
– FACT Spectral Deconvolution
– Optimization Strategy
Page 17
Method Editor for Semi Quant Method
700-ES Interference Avoidance and Removal Tools
– Wavelength Database
– Confirmation and Qualifier Wavelengths
– Hidden Wavelengths
– Semi Quant
– Echellogram (720 and 725-ES)
– Fitted Background Correction (FBC)
– FACT Spectral Deconvolution
– Optimization Strategy
Page 19
Echellogram Multi Element Solution
Echellogram Blank
Echellogram Multi-Element Solution - Blank
700-ES Interference Avoidance and Removal Tools
– Wavelength Database
– Confirmation and Qualifier Wavelengths
– Hidden Wavelengths
– Semi Quant
– Echellogram (720 and 725-ES)
– Fitted Background Correction (FBC)
– FACT Spectral Deconvolution
– Optimization Strategy
Page 23
Background Correction Options
Off Peak, Manually Selected Correction Points
FBC Fitted Background Correction
FACT (Fast Automated Curve-Fitting Technique)
25
FBC (Fitted Background Correction)
• Improved accuracy
• Requires no user input
• Truly simultaneous correction
Peak shaped functions applied to the analyte
peak
Polynomial Interpolation of background signal
Only Agilent offers Fitted Background Correction!
Pb 220 with 1000ppm Mo
700-ES Interference Avoidance and Removal Tools
– Wavelength Database
– Confirmation and Qualifier Wavelengths
– Hidden Wavelengths
– Semi Quant
– Echellogram (720 and 725-ES)
– Fitted Background Correction (FBC)
– FACT Spectral Deconvolution
– Optimization Strategy
Page 26
27
FACT (Fast Automated Curve-fitting Technique)
Peak modeling approach - Uses spectral data from analyte and interference standards
to de-convolve the analyte peak from nearby interference peaks
• Resolves extremely complex
spectral interferences
• Gives access to extra
wavelengths for improved
validation
• Allows resolution of interferences
as close as 3 pm
700-ES Interference Avoidance and Removal Tools
– Wavelength Database
– Confirmation and Qualifier Wavelengths
– Hidden Wavelengths
– Semi Quant
– Echellogram (720 and 725-ES)
– Fitted Background Correction (FBC)
– FACT Spectral Deconvolution
– Optimization Strategy
Page 28
Condition Set “A”
Low Power, High Neb
Flow, Low viewing height
Condition Set “B”
High Power, Low Neb
Flow, Mid viewing height
Optimization Strategy
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30
Choice of three different optimization criteria
– Signal to Background Ratio (SBR), Intensity, Signal to Root Background
ratio (SRBR).
Optimize all or sub-set of
Optimization Strategy: AutoMax
Flame AAS
ICP-MS
AAS instruments can be
flame only, furnace only, or
combined (switchable)
4100 MP-AES
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ICP-OES
Graphite Furnace AAS
ICP-QQQ
Agilent’s Atomic Spectroscopy Portfolio
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