Implementing Low-Power CRC-Half for RFID Circuits

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Implementing Low-Power CRC-Half for RFID Circuits. Qi Mi & Zhi Li ECE 632 – Fall, 2008 University of Virginia. Outline. Introduction Problem Statement Contribution Design Simulation Conclusion Future Work Q & A. Introduction. RFID applications RFID security issues. - PowerPoint PPT Presentation

Transcript of Implementing Low-Power CRC-Half for RFID Circuits

Qi Mi & Zhi LiECE 632 – Fall, 2008University of Virginia

OutlineIntroductionProblem StatementContributionDesignSimulationConclusionFuture WorkQ & A

IntroductionRFID applications

RFID security issues

Problem StatementConstraint:

Energy – foremost constraintSizeComplexity

Problem: We seek to find a feasible way of implementing low-power data encryption on RFID tags.

ContributionImplemented the core hash function (i.e., CRC-

Half) of CRC-MAC with PTM 90nm technology.

Analyzed energy at different operating voltages.

Gave an optimal operating voltage point for CRC-MAC.

Analyzed the trend of leakage current of the circuit.

CRC-MAC Briefing

Fig 1. A hardware implementation of CRC-MAC

CRC-MAC Briefing (cont’d)

Fig 2. C implementation of CRC-MAC as keyed one-way function

Circuit Design

Fig 3. A symbol view of CRC-Half

Simulation

Optimization DesignMetric: Total energy consumption

E/op = Eactive + Eleakage = CeffVDD2 + IlkgVDDTD

KnobsLower VDD (subthreshold design)

Robust, require CMOSShorten operation duration

th

DSDSTGSV

V

s

VVV

oLKG eL

WII 110

SimulationTechnology: PTM 90nm TechnologyCircuit Description: netlistsSimulation Environment

Schematic-level Software: FPGA Advantage 7.0 LS

Circuit-level Software: Cadence 2005 Simulator: Ocean with Spectre

Simulation (cont’d)Approach

Spectre Simulation Result

Data word: 0010 1001 0010 1101Key word: 1101 0010 0001 0111Output: 1011 0001 0001 0111

1

1

1

0

Leakage Current Simulation

s

VVV

oD

DSTGS

L

WII

10

Exponential Reduction as VDD decreases due to DIBL effect

Leakage Current is independent of CLK rate

Current Waveform in One Cycle

Pavg = α0→1fCeffVDD2

A higher CLK rate helps reduce energy consumption for a certain VDD

Total Energy per CRC cycleVDD

(V)

Tcr (ns) Iavg (A) Etotal (nJ)

0.5 10 3.09E-05 1.55E-03

0.45 15 1.98E-05 1.33E-03

0.4 20 1.33E-05 1.06E-03

0.35 40 6.20E-06 8.68E-04

0.3 70 3.50E-06 7.36E-04

0.25 200 1.53E-06 7.63E-04

0.2 700 7.16E-07 1.00E-03

0.15 1800 4.84E-07 1.31E-03

/total DD avg CRC CLKE V I n f

Energy Consumption Plot• The optimal supply voltage is around 0.3V• Leakage energy consumption starts to dominate in the sub-threshold region• Leakage current is taking up a large proportion of average current

ConclusionCRC-processing circuit is simulated in FPGA

and CadenceAverage and leakage currents are simulatedEnergy consumption comparison for different

VDD and VDD optimization for minimum energy consumption

Future WorkUse multiple power supplies to speed up the

critical pathSize up some parts of the circuit to increase

speedAdd high VT NMOS to the PDN to reduce

leakage

Q and A?

Thank you!