Post on 31-Dec-2015
HL-LHC/LARP, QXF Test Facility Workshop– R. Carcagno
QXF Test Requirements
Ruben CarcagnoBNL Workshop
December 17, 2013
HL-LHC/LARP, QXF Test Facility Workshop– R. Carcagno
• US Deliverables– Q1 and Q3 Cold Masses
• Both identical• Each requires two 4.8m long cold masses (MQXF)• Total of 20 individual (10 paired) cold masses to be delivered by the US
• QXF Magnet Types– SQXF: “Short” prototypes– LQXF: “Long” prototypes– MQXF: Production
QXF Magnets
2
HL-LHC/LARP, QXF Test Facility Workshop– R. Carcagno
MQXF Deliverable• Options
1. Cold Mass (coils and Al. Shell), ~4.3 m long, no test
2. He SSL vessel 4.3 m long single tested magnets to be paired, aligned, welded and tested as a cryostated assembly at CERN.
3. Fully finished SS He Vessel double magnet, ~9 m long, with inter-magnet connection(s)
Scope #3
Scope #2
Scope #1
U.S.
CERN
HL-LHC/LARP, QXF Test Facility Workshop– R. Carcagno
Geometry and Parameters
4
SQXF LQXF MQXF
(Short Prototype) (Long Prototype) (Production) Magnet Type Quadrupole Aperture 150 mm Overall Length 1973 mm 4785 mm Max Support Structure OD (with He vessel)
630 mm
Magnet Weight 3946 Kg 9490 Kg Operating Temperature 1.9 K Operating Current 17550 A Operating Gradient 140 T/m Peak Field at Operating Current 12.2 T Magnetic Length 1188 mm 4000 mm Stored Energy at Operating Current 1.6 MJ 5.3 MJ Inductance and Operating Current 9.8 mH 33 mH Short Sample Gradient 172 T/m Short Sample Current 21500 A Short Sample Peak Field 15 T Maximum Coil MIITs 37
SQXF LQXF
mm mm
magnetic length 1188 4000
LE magnetic end to end of conductor 60 60
RE magnetic end to end of conductor 60 60
RE end saddle 45 45
LE end saddle 30 30
splice extension 140 140
LE G10 insulation + SS pusher 20 20
RE G10 insulation + SS pusher 20 20
Max length of support structure 1563 4375
LE end plate 65 65
RE end plate 65 65
LE bolts & nuts 65 65
RE bolts & nuts 65 65
LE splice box 50 50
margin 100 100
TOTAL (overall length) 1973 4785
HL-LHC/LARP, QXF Test Facility Workshop– R. Carcagno
Preliminary Test Objectives
• At room temperature:– Hipot Measurement– Magnetic Measurements
• Rotating probe measurements
• Measurements during cooldown and warmup
– RTD measurements– Strain Gauge measurements– Residual Resistivity Ratio (RRR) Measurements
• Measurements at 4.5 K and 1.9 K:
– Hipot Measurement (at 4.5K only)– Magnetic Measurements
• Rotating probe measurements– Quench Training up to 90% of short sample limit– Quench Characterization
• Voltage taps measurements• Quench Antenna measurements
– Quench Propagation Studies– Ramp Rate Dependence Measurements– Voltage Spikes Measurements– Energy Loss Measurements (at 4.5K only)– Splice Measurements (at 4.5K only)
• A thermal cycle will be included.– 1.9 K testing after the thermal cycle should be enough to assess
training memory. And we will do some magnetic measurements to check the field quality reproducibility after the thermal cycle.
• At room temperature:– Hipot Measurement– Magnetic Measurements
• Rotating probe measurements
• Measurements during cooldown and warmup
– RTD measurements– Residual Resistivity Ratio (RRR) Measurements
• Measurements at 1.9 K:
– Hipot Measurement– Magnetic Measurements
• Rotating probe measurements
– Quench Training up to 90% of short sample limit
– Quench Characterization• Voltage taps measurements• Quench Antenna measurements
• No Thermal Cycle
SQXF and LQXF MQXF
HL-LHC/LARP, QXF Test Facility Workshop– R. Carcagno
MQXF Configurations• The exact configuration for MQXF cold mass testing has not been
decided yet, and it depends on the final agreement between the US and CERN for the MQXF deliverable. The following options are possible examples: – Testing a single MQXF cold mass with or without the stainless steel shell on
a vertical test stand – Testing a single MQXF cold mass with a stainless steel shell on a horizontal
test stand– Testing a double MQXF cold mass with a Stainless Steel shell on a horizontal
test stand. In this case, the test stand should be capable of powering each cold mass independently and together.
• For options (2) and (3), a reusable cryostat where the cold mass is
inserted and then removed would be needed for testing.
HL-LHC/LARP, QXF Test Facility Workshop– R. Carcagno
Requirements
• Cooldown/warmup– Maximum gradient between magnet ends < 100K
• Test Temperature: 1.9K– Stability: +/- 20 mK
• Temperature Measurements– Up to 5 CERNOX sensors,
• Range: room temperature to 1.9K• Absolute accuracy at 1.9K: +/- 10 mK
• Hipot– Coil to ground, heaters to ground, and heaters to coil: 1,000 V with < 2
uA leakage current at room temperature in air and cold in LHe (preliminary, hipot voltage may need to be higher)
HL-LHC/LARP, QXF Test Facility Workshop– R. Carcagno
Requirements (Cont.)
• Maximum Test Current: 21.5 kA– Short Sample Limit at 1.9K
• Number of Quenches– Plan for at least 30 quenches at 1.9K. In production 4.5K training
can be avoided unless we find a specific issue in the magnet requiring temperature dependence to understand it.
• Maximum Current Ramp Rate: 400 A/s– User-adjustable and changeable during ramp
• Magnetic Measurements– Room Temperature Rotating Probe (100 mm diameter) on 150 mm
cold mass aperture– Include Field Strength and Harmonics
HL-LHC/LARP, QXF Test Facility Workshop– R. Carcagno
Quench Protection• Quench Detection Channels and Thresholds
– (WC – Ref) Threshold: 5 V– (WC – Idot) Threshold: 3 V– (HC – HC) Threshold: 100 – 2,500 mV
• Thresholds must be current-dependent to overcome voltage spikes at lower currents
– Trigger delay: < 1 ms minimum• Heaters
– 16-20 Strip Heaters wired in 4-5 user-configurable independent groups• User-adjustable delay in the range 0 – 1000 ms
– Up to 4 spot heaters• Energy Extraction Resistor
– Configurable between 2.5 mΩ to 50 mΩ• User-adjustable delay in the range 0 – 1000 ms
HL-LHC/LARP, QXF Test Facility Workshop– R. Carcagno
Quench Characterization
• Up to 80 Voltage Taps for QC• Up to 40 Quench Antenna Channels • Flexible user configuration• DAQ– Minimum sampling rate: 10 kHz– Minimum # pre-trigger samples: 20,000– Minimum # post-trigger samples: 20,000– Minimum time window: 4 seconds
HL-LHC/LARP, QXF Test Facility Workshop– R. Carcagno
Voltage Spikes
• Dedicated half-coil segment voltage taps provided for voltage spike measurements
• DAQ– Continuously sampling at > 100 kHz– Threshold in the range 5 mV to 1,000 mV– Data logging after crossing threshold with a 0.5
second minimum– Synchronization with magnetic measurement
system
HL-LHC/LARP, QXF Test Facility Workshop– R. Carcagno
Strain Gauges
• Up to 64 4-wire resistive strain gauge bridge configurations
• Readings performed at a maximum interval of 1 minute during cooldown
• We plan strain gauge measurements at high frequency (close to 1 Hz) during every current ramp up. This is to check for pole unloading at high current and for repeatability
HL-LHC/LARP, QXF Test Facility Workshop– R. Carcagno
Misc
• Energy Loss Measurements– Performed at 4.5K using a current range of 500 – 6500 A and
a ramp rate in the range 20-300 A/s• RRR Measurements– Performed form 4.5K to 300K recording current and voltages
• Splice Measurements– Coil splice measurements at 4.5K one at a time using special
voltage taps at each side of the splice and measuring voltages with a high precision DMM while stepping current up to the maximum of short sample current
HL-LHC/LARP, QXF Test Facility Workshop– R. Carcagno
Schedule• SQXF Test Facility
– Operational by November 2014– Total of 4 LARP full SQXF cold masses
• LQXF Test Facility– Operational by August 2015– Total of 4 LARP full LQXF tests– Last test November 2017
• MQXF Test Facility– Operational by November 2018– Total of 20 LARP MQXF tests
• Either as 20 independent single cold masses or 10 double cold masses (to be determined)
– Last test May 2021
HL-LHC/LARP, QXF Test Facility Workshop– R. Carcagno
Test Cycle Duration
• Test cycle: installation, cooldown, test, warmup, and removal
• Assumptions (to be validated)– SQXF: 2 months– LQXF: 2 months– MQXF (single cold mass): 1 month– MQXF (double cold mass): 2 months
• For the first two production cold masses, a learning factor multiplier of 1.5 and 1.25 is assumed for the test cycle duration