Bruker IRIS TERS-Enabled AFM-Raman Systems

Bruker IRIS

TERS-Enabled AFM-Raman Systems

Seamless Integration of Atomic Force Microscopy and Raman Spectroscopy

April 21, 2023 1

• Easy-to-Use AFMs for Spectroscopy in Materials & Life Sciences

• Highest Performance, Most Complete AFM Capabilities

• TERS-Ready AFM-Raman Integration

• True Nanoscale Spectroscopy Targeted to Your Application

IRIS = Integrated AFM-Raman Imaging System

Bruker IRIS

The Innova-IRIS-inVia System

BrukerInnova-IRIS

Renishaw inViaRaman microscope

Efficientdirect opticalcoupling

Flexible sampling armFlexible sampling arm

Bruker Nano Surfaces – Renishaw 2

TERS Data Malachite Green STM results

Data acquired using Innova-IRIS-inVia system

Tip in feedbackTip retracted 50 nmTip retracted 100 nm

Bruker Nano Surfaces – Renishaw 3

Prof. A. Balter, Physics Department Prof. A. Balter, Physics Department UMK, Toruń, Poland UMK, Toruń, Poland

With Renishaw InVia With Horiba XploRA INV

April 21, 2023 4Bruker IRIS

Catalyst™-IRIS based systems for transparent samples

Tailored SolutionsAFM-Raman SystemsFor Your Application

www.bruker.com

Bruker IRIS TERS-Enabled AFM-Raman Systems

Documents

Transcript of Bruker IRIS TERS-Enabled AFM-Raman Systems

Quick Start Bruker MultiMode 8 AFM MultiMode/MultiMode Users Manual.pdf · If you have not done so read the Experiment Guide in the online manual, it has detailed descriptions of

Bruker HRXRD Instrument Setup for HRXRD and XRRprism.mit.edu/xray/oldsite/bruker hrxrd basic operation.pdf · 2012-04-18 · Bruker D8 HRXRD Basic Operation of the Bruker D8 HRXRD

Accurate thickness measurement of graphene · Atomic force microscopy was performed using a Bruker Dimension FastScan AFM with Nanoscope V controller, operating in PeakForce Tapping

Platform - Horiba€¦ · Si substrate Sample courtesy of Dr Filippo Fabbri (IMEM) TERS and AFM images – Carbon nanotubes on glass TERS/TEPL image – CVD grown WS 2 on Si substrate

XRD - Bruker

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160 The Electrochemical Society Chemical and Morphological ... molina/7_2013c Journal of the... · mode with a Bruker Vector-22 system, AFM by NanoSurf EasyScan-2, as well as their

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Bruker Dimension Icon AFM Quick User’s Guidemmrc.caltech.edu/AFM Dimension Icon/Icon-AFM Users Manual.pdf · Bruker Dimension Icon AFM Quick User’s Guide March 3, 2015 GLA Contacts

Operation of Interleave Scanning and LiftModemmrc.caltech.edu/AFM Dimension Icon/Bruker Training... · Web viewIf there is a DC voltage difference between the tip and sample, then

Application Note #138 - Bruker · that the signals are transmitted along the cell and between Figure 4: Mechanical stimulation of living dorsal root ganglions by a modified AFM probe.

SCIM® - Bruhn NewTech · 2020. 11. 18. · Bruker RAID-1 Bruker RAID-M Bruker RAID-M 100 Bruker RAID-S Bruker RAID-S2 Bruker RAID-S2 Plus Bruker RAID-XP Bruker RAPID (Stand-off)

P h y s i c stry Journal of Physical Chemistry & f o io l ......-20ºC prior to AFM study. A Dimension Icon AFM (Bruker AXS, Santa Barbara, CA, USA) was used to image the dehydrated

User Guide - California Institute of Technologymmrc.caltech.edu/AFM Dimension Icon/Bruker Training/004-1036-000... · PeakForce Tapping mode produces similar results to HarmoniX (see

Non-Contact Mode AFM vs. Tapping Mode AFM - … · 92 Non-Contact Mode AFM vs. Tapping Mode AFM The first Non-Contact AFM (NC-AFM) was developed by Martin et al in 1987. 1 NC-AFM

Excellent Response and Recovery Time of Photo …...force microscopy (NC-AFM) (Bruker MultiMode 8 HR, Germany). Thickness of ﬁlms was determined by proﬁlometer (KLA Tencor, P-16+)