Post on 21-Dec-2015
2
UCSB Hybrid Testing StatusUCSB Hybrid Testing Status
Weekly CumulativePass Fail Pass Fail % Pass
L12su 0 0 0 0 0.00%L12sd 0 0 0 0 0.00%L12pd 0 0 0 0 0.00%L34p+L12pu 1 0 370 6 98.40%L56p 12 -3 585 4 99.32%R2N 0 0 0 0 0.00%R2S 0 0 0 0 0.00%R5N 0 1 75 4 94.94%R5S 0 0 108 0 100.00%R6 1 -1 118 5 95.93%R7 7 0 53 2 96.36%Total 21 -3 1309 21 98.42%
3
UCSB Hybrid Testing FailuresUCSB Hybrid Testing Failures
This Week:1 shorts in PA
• Repairable4 modules repaired
Cumulative:1 with Shorts in PA
• Repairable1 Major Scratch in PA
• Repairable2 noisy on edge channels
• Should be ok1 Smashed APV-PA Bonds
• Repairable6 Failed Inspection
• Never should have sent1 Broken Ceramic1 Bad Bond Feet1 Weak Wirebonds1 Too Many Opens4 with unknown failure
• Effects entire chip(s)
4
FNAL Hybrid Testing StatusFNAL Hybrid Testing Status
Weekly CumulativePass Fail Pass Fail % Pass
L12su 0 0 0 0 0.00%L12sd 0 0 0 0 0.00%L12pd 0 0 0 0 0.00%L34p+L12pu 0 0 291 14 95.41%L56p 33 0 549 8 98.56%R2N 0 0 12 0 100.00%R2S 0 0 19 0 100.00%R5N 0 0 32 1 96.97%R5S 0 0 44 3 93.62%R6 24 1 42 2 95.45%R7 0 0 0 0 0.00%Total 57 1 989 28 97.25%
5
FNAL Hybrid Testing FailuresFNAL Hybrid Testing Failures
This Week: Cumulative:7 with Shorts in PA
• Repairable
1 Major Scratch in PA• Repairable
1 Damaged during repair
5 Too Many Opens + Noisy
14 with unknown failure• Effects entire chip(s)
6
US Hybrid Testing StatusUS Hybrid Testing Status
Weekly CumulativePass Fail Pass Fail % Pass
L12su 0 0 0 0 0.00%L12sd 0 0 0 0 0.00%L12pd 0 0 0 0 0.00%L34p+L12pu 1 0 661 20 97.06%L56p 45 -3 1134 12 98.95%R2N 0 0 12 0 100.00%R2S 0 0 19 0 100.00%R5N 0 1 107 5 95.54%R5S 0 0 152 3 98.06%R6 25 0 160 7 95.81%R7 7 0 53 2 0.00%Total 78 -2 2298 49 97.91%
7
UCSB ARCS Testing StatusUCSB ARCS Testing Status
Weekly CumulativeA B F A B F % A or B
L12pu 0 0 0 0 0 0 0.00%L12pd 0 0 0 0 0 0 0.00%L12su 0 0 0 0 0 0 0.00%L12sd 0 0 0 0 0 0 0.00%L34p 24 0 0 169 1 2 98.84%L56p 12 0 0 520 1 3 99.43%R5N 0 0 0 64 1 1 98.48%R5S 0 0 0 42 0 0 100.00%R6 21 0 0 118 0 0 100.00%R7 23 0 0 23 0 0 100.00%Total 80 0 0 936 3 6 99.37%
8
UCSB ARCS Testing FailuresUCSB ARCS Testing Failures
This WeekNone
Cumulative2 with too much current
1 with >2% bad channels
1 with bad DCU• Repairable
1 with CF frame shorted to HV• Repairable
1 with bad Dec. Mode chip
9
UCSB ARCS Testing Results UCSB ARCS Testing Results
945 Total Tested936 Grade A
3 Grade B
6 Grade F
This week:10 of 44032 channels bad (0.023%)
Total Production:304.5 of 643328 channels bad (0.047%)
Total UCSB HPK Modules Tested
0100200300400500600700800900
1000
1/3/
05
1/17
/05
1/31
/05
2/14
/05
2/28
/05
3/14
/05
3/28
/05
4/11
/05
4/25
/05
5/9/
05
5/23
/05
6/6/
05
Grade A
Grade B
Grade F
Total
Weekly UCSB HPK Modules Tested
010
2030
4050
6070
8090
100
1/3
/05
1/1
7/0
5
1/3
1/0
5
2/1
4/0
5
2/2
8/0
5
3/1
4/0
5
3/2
8/0
5
4/1
1/0
5
4/2
5/0
5
5/9
/05
5/2
3/0
5
6/6
/05
Grade A
Grade B
Grade F
Total
10
FNAL ARCS Testing StatusFNAL ARCS Testing Status
Weekly CumulativeA B F A B F % A or B
L12pu 0 0 0 12 0 0 0.00%L12pd 0 0 0 0 0 0 0.00%L12su 0 0 0 0 0 0 0.00%L12sd 0 0 0 0 0 0 0.00%L34p 9 0 0 216 1 2 99.09%L56p 51 0 0 509 1 3 99.42%R5N 0 0 0 0 0 0 0.00%R5S 0 0 0 0 0 0 0.00%R6 0 0 0 0 0 0 0.00%R7 0 0 0 0 0 0 0.00%Total 60 0 0 737 2 5 99.33%
11
FNAL ARCS Testing FailuresFNAL ARCS Testing Failures
This Week (8387-8446, 60 modules).• 1 mod, real pinholes (8417, chs 1,4,6,7 PASi pulled), OK.• 1 mod 30 mkA at 15V (8421, ch 289 PASi pulled), OK.• no PHL- • 3 SHT (8411, 8430, 8434).
Cumulative (7835-8446)2 grade “B” (mishandling; missing bonds on p/a)7970 - breakdown current behavior @430VTotal of 14 pinholesGrade F – problem with chip #2 (every 8th channel is identified as PHL-)Grade F-High current 8289
Cumulative (7702-8446, 745 modules, ARCSed 744)
2 grade “B” (mishandling; missing bonds on p/a)2 grade “F” mishandling1 grade “F” under study7970 - breakdown current behavior @430V
12
FNAL ARCS Testing Results FNAL ARCS Testing Results
747 Total Tested737 Grade A
2 Grade B
5 Grade F
This week:
Total Production:
13
US ARCS Testing StatusUS ARCS Testing Status
Weekly CumulativeA B F A B F % A or B
L12pu 0 0 0 12 0 0 0.00%L12pd 0 0 0 0 0 0 0.00%L12su 0 0 0 0 0 0 0.00%L12sd 0 0 0 0 0 0 0.00%L34p 33 0 0 385 2 4 98.98%L56p 63 0 0 1029 2 6 99.42%R5N 0 0 0 64 1 1 98.48%R5S 0 0 0 42 0 0 100.00%R6 21 0 0 118 0 0 100.00%R7 23 0 0 23 0 0 0.00%Total 140 0 0 1673 5 11 99.35%
14
UCSB LT Testing StatusUCSB LT Testing Status
Failed module has too much current
Weekly CumulativePass Fail Pass Fail % Pass
L12pu 0 0 0 0 0.00%L12pd 0 0 0 0 0.00%L12su 0 0 0 0 0.00%L12sd 0 0 0 0 0.00%L34p 28 0 169 1 99.41%L56p 0 0 493 0 100.00%R5N 1 0 68 0 100.00%R5S 0 0 41 0 100.00%R6 18 0 118 0 100.00%R7 11 0 11 0 100.00%Total 58 0 900 1 99.89%
15
Modules 30200020008325 – 8345, 8425-8434, 8413-8422 were tested during June 9 – June 13.We did 4 runs.K-Mux errors were happening two times – only in the beginning of new run,
program had to be restartedQuick connect between hose and coldbox was damaged and leaking. Replaced
quick connect and renewed the liquid – delay in one run.
Module 8348 had high leakage current (~2.8uA@450V) and steeper then usual.
Modules 8331, 8336-8345, 8431 had high noise in the cold record (~3.5ADC) -> all channels marked NOISY -> xml :-1:
Possible reason – no HV bias during cold cycle. Need more quiet time to investigate.
Backlog: 54 modules
FNAL LT Testing StatusFNAL LT Testing Status
16
FNAL LT Testing StatusFNAL LT Testing Status
Weekly CumulativePass Fail Pass Fail % Pass
L12pu 0 0 0 0 0.00%L12pd 0 0 12 0 100.00%L12su 0 0 0 0 0.00%L12sd 0 0 0 0 0.00%L34p 0 0 216 1 99.54%L56p 40 0 472 1 99.79%R5N 0 0 0 0 0.00%R5S 0 0 0 0 0.00%R6 0 0 0 0 0.00%R7 0 0 0 0 0.00%Total 40 0 700 2 99.72%
17
US LT Testing StatusUS LT Testing Status
Weekly CumulativePass Fail Pass Fail % Pass
L12pu 0 0 0 0 0.00%L12pd 0 0 12 0 100.00%L12su 0 0 0 0 0.00%L12sd 0 0 0 0 0.00%L34p 28 0 385 2 99.48%L56p 40 0 965 1 99.90%R5N 1 0 68 0 100.00%R5S 0 0 41 0 0.00%R6 18 0 118 0 100.00%R7 11 0 11 0 100.00%Total 98 0 1600 3 99.81%